FK

Felix Kerstan

CG Carl Zeiss Micromanaging Gmbh: 6 patents #6 of 191Top 4%
CG Carl Zeiss Jena Gmbh: 3 patents #52 of 374Top 15%
CG Carl Zeiss Spectroscopy Gmbh: 2 patents #2 of 18Top 15%
JG Jenoptik Jena Gmbh: 2 patents #12 of 134Top 9%
Overall (All Time): #338,028 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12158414 Plurality of structurally identical spectrometers and a calibration method therefor Clemens Michael Bier, Torsten Büttner, Michael Barth 2024-12-03
11940378 Spectrometer system and method for testing of same Juergen Gobel 2024-03-26
8111396 Spectrometric measurement system and method for compensating for veiling glare Nico Correns, Joerg Margraf 2012-02-07
8102526 Spectrometer with a slit for incident light and fabrication of the slit Jens Hofmann, Nico Correns, Lutz Freytag, Doris Jochmann, Carsten Ziener +1 more 2012-01-24
7692790 Grating spectrometer system and method for the acquisition of measured values Nico Correns 2010-04-06
7573023 Arrangement and method for compensation of the temperature dependency of detectors in spectrometers Ulrich Zeh 2009-08-11
7502108 Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics Manfred Fritsch, Nico Correns 2009-03-10
7369228 Compact spectrometer Ullrich Klarner, Nico Correns, Gregor Tumpach 2008-05-06
7082003 Pressure compensating device for optical apparatus Nico Correns, Ullrich Klarner, Werner Hoyme 2006-07-25
6888637 Gas sample vessel for a gas analyzer Werner Hoyme, Nico Correns, Ullrich Klarner 2005-05-03
6762409 Method and device for determining the thickness and growth rate of an ice layer Manfred Fritsch, Nico Correns 2004-07-13
6654186 Arrangement for fixing an optical component part Ullrich Klarner, Nico Correns, Werner Hoyme 2003-11-25
4979823 Method and arrangement for background compensation in material analysis Joachim Mohr 1990-12-25
4856898 Adjustable echelle spectrometer arrangement and method for its adjustment Helmut Becker-Ross, Stefan Florek, Guenther Moebius, Horst Sanders 1989-08-15