Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12372462 | Method for controlling a semiconductor-laser-diode-based SS-interferometer system | Manfred Dick, Roland Bergner, Ralf Ebersbach, Thomas Pabst | 2025-07-29 |
| 12313402 | Method for compensating the artifacts generated by moving measurement objects in measurement signals of swept-source OCT systems | Michael Niederleithner | 2025-05-27 |
| 11086133 | Source module and optical system for line-field imaging | Laurin Ginner, Marcus DÜLK | 2021-08-10 |
| 10231616 | Systems and methods for sub-aperture based aberration measurement and correction in interferometric imaging | Abhishek Kumar, Alexandre R. Tumlinson | 2019-03-19 |
| 9775511 | Systems and methods for sub-aperture based aberration measurement and correction in interferometric imaging | Abhishek Kumar, Alexandre R. Tumlinson | 2017-10-03 |
| 9247874 | Systems and methods for sub-aperture based aberration measurement and correction in interferometric imaging | Abhishek Kumar, Alexandre R. Tumlinson | 2016-02-02 |
| 9046339 | Systems and methods for bidirectional functional optical coherence tomography | Cédric Blatter | 2015-06-02 |
| 8437008 | Interferometric sample measurement | Adolf Friedrich Fercher | 2013-05-07 |
| 7982881 | Apparatus and method for interferometric measurement of a sample | Adolf Friedrich Fercher | 2011-07-19 |