Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9464891 | Method for measuring thickness by pulsed infrared thermal wave technology | Zhi Zeng, Xun Wang, Ning Tao, Cunlin Zhang | 2016-10-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9464891 | Method for measuring thickness by pulsed infrared thermal wave technology | Zhi Zeng, Xun Wang, Ning Tao, Cunlin Zhang | 2016-10-11 |