YM

Yohei Murayama

Canon: 15 patents #4,433 of 19,416Top 25%
Overall (All Time): #318,875 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10535519 Photocurable composition, method for forming a pattern, and method for producing a photocured product Toshiki Ito, Chieko Mihara, Motoki Okinaka 2020-01-14
10184885 Information processing device to process spectral information, and information processing method Kota Iwasaki, Masafumi Kyogaku 2019-01-22
9704710 Photocured product and method for producing the same Toshiki Ito, Chieko Mihara, Motoki Okinaka 2017-07-11
9627177 Mass spectrometer and mass image analyzing system Naofumi Aoki, Masafumi Kyogaku, Kota Iwasaki 2017-04-18
9086404 Method for treating living samples and analyzing the same Manabu Komatsu, Hiroyuki Hashimoto, Kazuhiro Ban 2015-07-21
8986943 Method for pre-treating specimen and method for analyzing specimen Hiroyuki Hashimoto, Manabu Komatsu, Kazuhiro Ban 2015-03-24
8963078 Ion group irradiation device and secondary ion mass spectrometer Kota Iwasaki, Masafumi Kyogaku 2015-02-24
8962302 Biological tissue processing substrate for fixing proteins or protein degradation products in tissue for analysis Kazuhiro Ban, Miki Ogawa, Norihiko Utsunomiya, Hiroyuki Hashimoto, Manabu Komatsu 2015-02-24
8415116 Method for pre-treating specimen and method for analyzing specimen Hiroyuki Hashimoto, Manabu Komatsu, Kazuhiro Ban 2013-04-09
8217340 Mass spectrometry substrate and mass spectrometry method Kimihiro Yoshimura, Manabu Komatsu, Hiroyuki Hashimoto 2012-07-10
7956321 Method of measuring target object in a sample using mass spectrometry Manabu Komatsu, Hiroyuki Hashimoto 2011-06-07
7851749 Method for obtaining information and device therefor Manabu Komatsu, Hiroyuki Hashimoto, Kazuhiro Ban 2010-12-14
7795579 Information obtaining method Manabu Komatsu, Hiroyuki Hashimoto, Kazuhiro Ban 2010-09-14
7560689 High-sensitivity mass spectrometer and method Kazuhiro Ban, Hiroyuki Hashimoto, Manabu Komatsu, Norihiko Utsunomiya 2009-07-14
7446309 In-plane distribution measurement method Manabu Komatsu, Hiroyuki Hashimoto 2008-11-04