Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774493 | Semiconductor integrated circuit, method of testing the semiconductor integrated circuit, and semiconductor substrate | Eiki Aoyama | 2023-10-03 |
| 10650905 | Inspection apparatus, image sensing apparatus, electronic equipment, and transportation equipment | — | 2020-05-12 |