AT

Atsushi Takayanagi

Canon: 33 patents #1,573 of 19,416Top 9%
KC Kyosan Electric Mfg. Co.: 4 patents #14 of 57Top 25%
KU Keio University: 2 patents #97 of 781Top 15%
KA Kao: 1 patents #1,961 of 3,221Top 65%
TC Toagosei Co.: 1 patents #155 of 338Top 50%
Overall (All Time): #79,879 of 4,157,543Top 2%
40
Patents All Time

Issued Patents All Time

Showing 26–40 of 40 patents

Patent #TitleCo-InventorsDate
7985545 Probe, probe set, and probe carrier for detecting DNA of Trichophyton violaceum Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-07-26
7985544 Probe, probe set, and probe carrier for detecting DNA of Trichophyton verrucosum Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-07-26
7960539 Probe, probe set, probe carrier, and testing method Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-06-14
7960538 Probe, probe set, probe carrier, and testing method Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-06-14
7951932 Probe, probe set, probe carrier, and testing method Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-05-31
7947445 Method of detecting DNA of Candida guilliermondii Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-05-24
7935810 Probe, probe set, probe carrier, and testing method Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-05-03
7935809 Probe, probe set, probe carrier, and testing method Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-05-03
7906286 Probe set, probe carrier, and method for determining and identifying fungus Toshifumi Fukui, Nobuhiro Tomatsu, Nobuyoshi Shimizu 2011-03-15
7888026 Probe, probe set, probe carrier, and testing method for detecting DNA of Candida parapsilosis Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-02-15
7863000 Probe, probe set and probe carrier for detecting Candida lusitaniae Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2011-01-04
7858315 Probe, probe set, probe carrier, and testing method Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2010-12-28
7858314 Probe, probe set, probe carrier, and testing method Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2010-12-28
7795418 Probe, probe set, probe carrier, and testing method Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu 2010-09-14
7751211 Instantaneous voltage-drop compensation circuit, power conversion apparatus, instantaneous voltage-drop compensation method and computer readable medium storing instantaneous voltage-drop compensation program Itsuo Yuzurihara, Ryuichi Takamura 2010-07-06