Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8573077 | Wafer inspection system and a method for translating wafers | Amir Gilead, Michael Vainer, Valery Nuzni | 2013-11-05 |
| 8281674 | Wafer inspection system and a method for translating wafers [PD] | Amir Gilead, Michael Vainer, Valery Nuzni | 2012-10-09 |