Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7049588 | Device for measuring the emission of X-rays produced by an object exposed to an electron beam | Emmanuel De Chambost, Chrystel Hombourger, Juan Montero, Pierre-Francois Staub | 2006-05-23 |
| 6259530 | Method and device for measuring the depths of bottoms of craters in a physico-chemical analyzer | — | 2001-07-10 |