Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4604523 | Scannable-beam microscopes and image stores therefor | William Ralph Knowles | 1986-08-05 |
| 4587617 | Image inspection system for defect detection | John C. Barker | 1986-05-06 |