Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11156660 | In-system scan test of electronic devices | Mitchell G. Poplack, Xiaolei Guo, Justin Schmelzer | 2021-10-26 |
| 10997343 | In-system scan test of chips in an emulation system | Mitchell G. Poplack, Xiaolei Guo, Justin Schmelzer | 2021-05-04 |