TT

Thorsten Trupke

BP Bt Imaging Pty: 17 patents #1 of 6Top 20%
NL Newsouth Innovations Pty Limited: 1 patents #97 of 268Top 40%
Overall (All Time): #245,289 of 4,157,543Top 6%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12255582 Outdoor photoluminescence imaging of photovoltaic modules Oliver Kunz, Germaine Antoine REY, Appu Rshikesan PADUTHOL 2025-03-18
10502687 Methods for inspecting semiconductor wafers Juergen Weber 2019-12-10
10241051 Methods for inspecting semiconductor wafers Juergen Weber 2019-03-26
9909991 Method and system for inspecting indirect bandgap semiconductor structure Robert Andrew Bardos 2018-03-06
9912291 Method and system for testing indirect bandgap semiconductor devices using luminescence imaging Robert Andrew Bardos 2018-03-06
9885662 Methods for inspecting semiconductor wafers Juergen Weber 2018-02-06
9546955 Wafer imaging and processing method and apparatus Robert Andrew Bardos 2017-01-17
9482625 Method and system for testing indirect bandgap semiconductor devices using luminescence imaging Robert Andrew Bardos 2016-11-01
9234849 Method and system for inspecting indirect bandgap semiconductor structure Robert Andrew Bardos 2016-01-12
9157863 Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials 2015-10-13
9103792 Wafer imaging and processing method and apparatus Robert Andrew Bardos 2015-08-11
9035267 In-line photoluminescence imaging of semiconductor devices Ian Andrew Maxwell, Robert Andrew Bardos, Kenneth Edmund Arnett 2015-05-19
8742372 Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials 2014-06-03
8710860 Method and system for testing indirect bandgap semiconductor devices using luminescence imaging Robert Andrew Bardos 2014-04-29
8483476 Photovoltaic cell manufacturing Robert Andrew Bardos 2013-07-09
8218140 Method and system for inspecting indirect bandgap semiconductor stucture Robert Andrew Bardos 2012-07-10
8064054 Method and system for inspecting indirect bandgap semiconductor structure Robert Andrew Bardos 2011-11-22
7919762 Determining diffusion length of minority carriers using luminescence Robert Andrew Bardos, Peter Wilhelm Wurfel 2011-04-05