Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11796565 | AFM imaging with metrology-preserving real time denoising | Vladimir Fonoberov, James Young, Sean Hand | 2023-10-24 |
| 11714104 | AFM imaging with creep correction | Sean Hand, Vladimir Fonoberov, James Young | 2023-08-01 |
| 11668730 | High speed atomic force profilometry of large areas | Vladimir Fonoberov, Sean Hand | 2023-06-06 |
| 11604210 | AFM imaging with real time drift correction | Vladimir Fonoberov, Sean Hand | 2023-03-14 |
| 10969406 | High speed atomic force profilometry of large areas | Vladimir Fonoberov, Sean Hand | 2021-04-06 |
| 9995763 | Precise probe placement in automated scanning probe microscopy systems | Eric Milligan, Andrew Lopez, Xianghai Wu, Sean Hand, Vladimir Fonoberov | 2018-06-12 |
| 7665349 | Method and apparatus for rapid automatic engagement of a probe | Paul I. Mininni, James M. Young, Charles Meyer | 2010-02-23 |
| 7429732 | Scanning probe microscopy method and apparatus utilizing sample pitch | David Kneeburg, Rohit Jain, Wei Yao, Matthew Klonowski, Ingo Schmitz | 2008-09-30 |