JK

Joerg Kaercher

BG Bruker Axs Gmbh: 2 patents #12 of 73Top 20%
📍 Madison, WI: #624 of 4,527 inventorsTop 15%
🗺 Wisconsin: #6,037 of 40,088 inventorsTop 20%
Overall (All Time): #615,256 of 4,157,543Top 15%
8
Patents All Time

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDate
12078603 Method for the detection and correction of lens distortions in an electron diffraction system Sergey Lazarev, Christoph Ollinger 2024-09-03
10408949 Indirect photon-counting analytical X-ray detector Hao Jiang, Roger D. Durst 2019-09-10
9784698 Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode Roger D. Durst, Gregory A. WACHTER 2017-10-10
9417196 X-ray diffraction based crystal centering method using an active pixel array sensor in rolling shutter mode 2016-08-16
9372163 Method of conducting an X-ray diffraction-based crystallography analysis Michael P. Ruf, Bruce C Noll 2016-06-21
9022651 X-ray diffraction-based defective pixel correction method using an active pixel array sensor John L. Chambers 2015-05-05
8903043 Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode Roger D. Durst, Gregory A. WACHTER, John L. Chambers 2014-12-02
8680473 Multiply-sampled CMOS sensor for X-ray diffraction measurements with corrections for non-ideal sensor behavior Roger D. Durst, Gregory A. WACHTER 2014-03-25