Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9003561 | Device and method for measuring distribution of atomic resolution deformation | Bong Kyun JANG, Jae-Hyun Kim, Hak Joo Lee, Kyung Suk Kim | 2015-04-07 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9003561 | Device and method for measuring distribution of atomic resolution deformation | Bong Kyun JANG, Jae-Hyun Kim, Hak Joo Lee, Kyung Suk Kim | 2015-04-07 |