Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10823757 | Apparatus and methods for non-destructive inspection using microwave microscopy | Leandro Miguel Rufail, Fidele Moupfouma | 2020-11-03 |
| 7609778 | Methods, apparatus, and systems for reducing interference on nearby conductors | Karl Fecteau, Claude Thibeault, Yvon Savaria, Yves Blaquiere, Zhong-Fang Jin | 2009-10-27 |
| 6897497 | Methods, apparatus, and systems for reducing interference on nearby conductors | Yvon Savaria, Zhong-Fang Jin | 2005-05-24 |