Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12061935 | Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system | Dong Chai, Tian Lan, Haohan Wu, Guoliang Shen, Fei Yuan | 2024-08-13 |
| 12032364 | Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system | Dong Chai, Tian Lan, Haohan Wu, Guoliang Shen, Fei Yuan | 2024-07-09 |
| 11809438 | Method and device of detecting fault in production | Hong Wang, Dong Chai, Haohan Wu, Xuefeng Kan, Tian Lan | 2023-11-07 |
| 11797557 | Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis | Fei Yuan, Hong Wang, Jianmin Wu, Guoliang Shen, Tian Lan +4 more | 2023-10-24 |