Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11797557 | Data management platform, intelligent defect analysis system, intelligent defect analysis method, computer-program product, and method for defect analysis | Fei Yuan, Hong Wang, Jianmin Wu, Guoliang Shen, Tian Lan +4 more | 2023-10-24 |