| 12203894 |
Methods and circuitry for built-in self-testing of circuitry and/or transducers in ultrasound devices |
Chao Chen, Youn-Jae Kook, Jihee Lee, Kailiang Chen, Leung Chiu +3 more |
2025-01-21 |
| 12156762 |
Apparatuses and methods for configuring ultrasound devices |
Nevada J. Sanchez |
2024-12-03 |
| 12023201 |
Methods and apparatuses for beamforming in ultrasound systems using unbuffered data samples |
Karl Thiele, Sheng-Wen Huang, Nevada J. Sanchez |
2024-07-02 |
| 11815492 |
Methods and circuitry for built-in self-testing of circuitry and/or transducers in ultrasound devices |
Chao Chen, Youn-Jae Kook, Jihee Lee, Kailiang Chen, Leung Chiu +3 more |
2023-11-14 |
| 11690595 |
Methods and apparatuses for offloading ultrasound data |
Nevada J. Sanchez, Graham Peyton |
2023-07-04 |
| 9972654 |
Image sensor with heating effect and related methods |
Victor Lenchenkov |
2018-05-15 |
| 9812555 |
Bottom-gate thin-body transistors for stacked wafer integrated circuits |
Raminda Udaya Madurawe, Irfan Rahim |
2017-11-07 |
| 9584744 |
Image sensors with voltage-biased trench isolation structures |
Victor Lenchenkov |
2017-02-28 |
| 9431443 |
Image sensor with heating effect and related methods |
Victor Lenchenkov |
2016-08-30 |
| 5596218 |
Hot carrier-hard gate oxides by nitrogen implantation before gate oxidation |
Brian S. Doyle, Ara Philipossian |
1997-01-21 |
| 5385630 |
Process for increasing sacrificial oxide etch rate to reduce field oxide loss |
Ara Philipossian, Brian S. Doyle |
1995-01-31 |
| 5330920 |
Method of controlling gate oxide thickness in the fabrication of semiconductor devices |
Brian S. Doyle, Ara Philipossian |
1994-07-19 |
| 5316965 |
Method of decreasing the field oxide etch rate in isolation technology |
Ara Philipossian, Brian S. Doyle |
1994-05-31 |