Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8569714 | Double tilt transmission electron microscope sample holder for in-situ measurement of microstructures | Xiaodong Han, Yonghai Yue, Pan Liu, Kun Zheng, Xiaodong Wang +1 more | 2013-10-29 |
| 8069733 | Device and method for measuring electromechanical properties and microstructure of nano-materials under stress state | Xiaodong Han, Pan Liu, Yonghai Yue, Ze Zhang | 2011-12-06 |