Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10054484 | Measuring arrangement for reflection measurement | Jörg Margraf | 2018-08-21 |
| 5764352 | Process and apparatus for spectral reflectance and transmission measurements | Peter Kappel, Werner Lenz, Walter Müller, Christian Schäffer, Wilhelm Schebesta +2 more | 1998-06-09 |