Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| H922 | Method for analyzing materials using x-ray fluorescence | Wm. Timothy Ehm, John V. Gilfrich | 1991-05-07 |
| 4462689 | Wide band scanning monochromator | Milton N. Kabler, Richard T. Williams, Jack C. Rife, William R. Hunter, Neil C. Lien | 1984-07-31 |