Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5455516 | Meter and method for in situ measurement of the electromagnetic properties of various process materials using cutoff frequency characterization and analysis | Buford Randall Jean, Gary Lee Warren | 1995-10-03 |
| 5331284 | Meter and method for in situ measurement of the electromagnetic properties of various process materials using cutoff frequency characterization and analysis | Buford Randall Jean, Gary Lee Warren | 1994-07-19 |