Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11087523 | Production ray tracing of feature lines | Shinji Ogaki | 2021-08-10 |
| 9665974 | Methods and systems of joint path importance sampling | Wojciech Jarosz, Jaroslav Kr̆ivánek, Toshiya Hachisuka, Derek Nowrouzezahrai | 2017-05-30 |