Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 6922243 | Method of inspecting grain size of a polysilicon film | Kun-Chih Lin, Long-Sheng Liao | 2005-07-26 | $3,326,000 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 6922243 | Method of inspecting grain size of a polysilicon film | Kun-Chih Lin, Long-Sheng Liao | 2005-07-26 | $3,326,000 |