Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5986281 | Circuit and method for predicting failure rates in a semiconductor device | Jeffrey A. Reed, Ramin Khoini-Poorfard | 1999-11-16 |
| 5841382 | Fast testing of D/A converters | Robert W. Walden, Ramin Khoini-Poorfard | 1998-11-24 |