Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4585931 | Method for automatically identifying semiconductor wafers | Hibbert Alexander Duncan, Francis J. Ehret, Karen H. Kinney, Peter D. Parry | 1986-04-29 |
| 4344326 | Non-destructive testing of a laminated ceramic capacitor | — | 1982-08-17 |