Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6650779 | Method and apparatus for analyzing an image to detect and identify patterns | George J. Vachtesvanos, Lewis J. Dorrity, Peng Wang, Javier Echauz | 2003-11-18 |
| 5923781 | Segment detection system and method | Andrei Csipkes, John Mark Palmquist | 1999-07-13 |
| 5815198 | Method and apparatus for analyzing an image to detect and identify defects | George Vachtsevanos, J. Lewis Dorrity | 1998-09-29 |
| 5809162 | Surface analysis system and method | Andrei Csipkes, John Mark Palmquist | 1998-09-15 |