Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5206820 | Metrology system for analyzing panel misregistration in a panel manufacturing process and providing appropriate information for adjusting panel manufacturing processes | Hans H. Ammann, Richard F. Kovacs, Henry B. Micks, Jr., Jamey N. Potechin, Everett Simons +2 more | 1993-04-27 |