Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5646813 | Method and apparatus for reducing ESD during thermal shock testing | Min-Chung Jon, Douglas C. Smith | 1997-07-08 |
| H520 | Technique for increasing oxygen incorporation during silicon Czochralski | David L. Johnson, Robert J. Lavigna, Wen-Fei Lin, Raymond J. Newman, Subramani Rajaram +1 more | 1988-09-06 |