Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7573021 | Method and apparatus for multiple scan rate swept wavelength laser-based optical sensor interrogation system with optical path length measurement capability | Todd Christian Haber, Joel Leslie Mock | 2009-08-11 |
| 6011616 | Systems and methods for measuring the concentricity of a core to a ferrule | Calvin J. Martin, Walter S. Konik | 2000-01-04 |