DR

David R. Riese

AT AT&T: 1 patents #10,626 of 18,772Top 60%
Overall (All Time): #3,865,745 of 4,157,543Top 95%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5172420 Method for monitoring the dimensions and other aspects linewidth thickness and discoloration of specular patterns Rajarshi Ray 1992-12-15