Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10585067 | Method for non-destructive analysis of multiple structural parameters | Dag Horn, Jia Lei | 2020-03-10 |
| 9593930 | Apparatus and method for measuring deposits inside a tube | Richard Lakhan, Joseph Renaud, Laurie Davey | 2017-03-14 |