Issued Patents All Time
Showing 26–35 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6339683 | Standard measurement scale and markers for defining standard measurement scale | Atsushi Kida, Atsumi Kaneko | 2002-01-15 |
| 6314200 | Optical member inspecting apparatus and method of inspection thereof | Masato Hara, Masayuki Sugiura, Atsushi Kida | 2001-11-06 |
| 6304669 | Photogrammetric analytical measurement system | Atsumi Kaneko, Masato Hara, Atsushi Kida, Shigeru Wakashiro | 2001-10-16 |
| 6148097 | Optical member inspecting apparatus and method of inspection thereof | Masato Hara, Masayuki Sugiura, Atsushi Kida | 2000-11-14 |
| 6144761 | Photogrammetric analytical measurement system | Atsumi Kaneko, Atsushi Kida | 2000-11-07 |
| 6108497 | Standard measurement scale and markers for defining standard measurement scale | Atsushi Kida, Atsumi Kaneko | 2000-08-22 |
| 5995765 | Camera with distance-measuring sensor unit for use in photogrammetric analytical measurement | Atsumi Kaneko, Atsushi Kida | 1999-11-30 |
| 5847822 | Optical element inspecting apparatus | Masayuki Sugiura, Masato Hara, Atsushi Kida | 1998-12-08 |
| 5835207 | Optical member inspecting apparatus | Masayuki Sugiura, Masato Hara, Atsushi Kida | 1998-11-10 |
| 5828500 | Optical element inspecting apparatus | Atsushi Kida, Masato Hara, Masayuki Sugiura | 1998-10-27 |