Issued Patents All Time
Showing 1–25 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8415989 | Switching device for electric circuit | Akihiro Shinoda | 2013-04-09 |
| 7859138 | Drive circuit | Akio Iwabuchi | 2010-12-28 |
| 6853441 | Projection aligner | Yoshinori Kobayashi, Shigetomo Ishibashi | 2005-02-08 |
| 6839124 | Projection aligner | Yoshinori Kobayashi, Shigetomo Ishibashi | 2005-01-04 |
| 6807013 | Projection aligner | Yoshinori Kobayashi, Shigetomo Ishibashi | 2004-10-19 |
| 6804386 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2004-10-12 |
| 6788804 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2004-09-07 |
| 6727979 | Projection aligner | Yoshinori Kobayashi, Shigetomo Ishibashi | 2004-04-27 |
| 6717683 | Target for photogrammetric analytical measurement system | Shigeru Wakashiro, Atsumi Kaneko, Toshihiro Nakayama, Atsushi Kida, Masami Shirai +1 more | 2004-04-06 |
| 6697513 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2004-02-24 |
| 6636625 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2003-10-21 |
| 6628803 | Device for calculating positional data of standard points of photogrammetric target | Shigeru Wakashiro, Atsumi Kaneko, Toshihiro Nakayama, Atsushi Kida | 2003-09-30 |
| 6535627 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2003-03-18 |
| 6477264 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2002-11-05 |
| 6476909 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2002-11-05 |
| 6434263 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2002-08-13 |
| 6430310 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2002-08-06 |
| 6427023 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2002-07-30 |
| 6363165 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2002-03-26 |
| 6351554 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2002-02-26 |
| 6349145 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2002-02-19 |
| 6314200 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2001-11-06 |
| 6304669 | Photogrammetric analytical measurement system | Atsumi Kaneko, Toshihiro Nakayama, Atsushi Kida, Shigeru Wakashiro | 2001-10-16 |
| 6208475 | Optical-member inspection apparatus and holder for inspection target member | Kiyoshi Yamamoto, Masayuki Sugiura, Taichi Nakanishi, Takashi Tohara | 2001-03-27 |
| 6148097 | Optical member inspecting apparatus and method of inspection thereof | Toshihiro Nakayama, Masayuki Sugiura, Atsushi Kida | 2000-11-14 |