Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5974160 | Measuring method and apparatus of gloss irregularity and printing unevenness | Hidekazu Ishimura, Nobuko Yoshidomi | 1999-10-26 |
| 4243882 | Infrared multilayer film thickness measuring method and apparatus | Akitaka Yasujima, Shingo Ishikawa | 1981-01-06 |