Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9368332 | Microchannel plate devices with tunable resistive films | Steve Bachman, Philippe de Rouffignac, Anton Tremsin, David Beaulieu, Dmitry Gorelikov | 2016-06-14 |
| 9064676 | Microchannel plate devices with tunable conductive films | Steve Bachman, Philippe de Rouffignac, Anton Tremsin, David Beaulieu, Dmitry Gorelikov | 2015-06-23 |
| 8237129 | Microchannel plate devices with tunable resistive films | Anton Tremsin, Philippe de Rouffignac, David Beaulieu, Kourosh Saadatmand, Steve Bachman +2 more | 2012-08-07 |
| 8227965 | Microchannel plate devices with tunable resistive films | Steve Bachman, Philippe de Rouffignac, Anton Tremsin, David Beaulieu, Dmitry Gorelikov | 2012-07-24 |
| 8134108 | Image intensifying device | Anton Tremsin, Ken Stenton, Philippe de Rouffignac | 2012-03-13 |
| 8052884 | Method of fabricating microchannel plate devices with multiple emissive layers | David Beaulieu, Anton Tremsin, Philippe de Rouffignac, Michael D. Potter | 2011-11-08 |
| 7977617 | Image intensifying device having a microchannel plate with a resistive film for suppressing the generation of ions | Anton Tremsin, Ken Stenton, Philippe de Rouffignac | 2011-07-12 |
| 7855493 | Microchannel plate devices with multiple emissive layers | David Beaulieu, Anton Tremsin, Philippe de Rouffignac, Michael D. Potter | 2010-12-21 |
| 7759138 | Silicon microchannel plate devices with smooth pores and precise dimensions | David Beaulieu | 2010-07-20 |
| 6992287 | Apparatus and method for image optimization of samples in a scanning electron microscope | — | 2006-01-31 |
| 6825977 | Fixture for microscope component alignment | — | 2004-11-30 |
| 6717141 | Reduction of aberrations produced by Wien filter in a scanning electron microscope and the like | John Rouse, Ira Rosenberg | 2004-04-06 |
| 6717143 | Beam alignment in a lower column of a scanning electron microscope or the like | Paul J. Duval, Anastasia Tyurina | 2004-04-06 |
| 6593578 | Wien filter for use in a scanning electron microscope or the like | Paul J. Duval, Allan Rubin, Ira Rosenberg, Vladimir Vayner | 2003-07-15 |
| 4851264 | Reinforcement of refractories by pore saturation with particulated fillers | Subrata Banerjee | 1989-07-25 |