| 7393502 |
Test device for analysis of a liquid sample |
Akio Okubo, Yoshiyuki Tanaka, Yoshihiko Higuchi, Masufumi Koike |
2008-07-01 |
| 7189576 |
Method for measuring substance and testing piece |
Takao Fukuoka, Kenji Yamamoto, Satoshi Yonehara |
2007-03-13 |
| 7153696 |
Method for measuring substance and testing piece |
Takao Fukuoka, Kenji Yamamoto, Satoshi Yonehara |
2006-12-26 |
| 7098038 |
Method for measuring substance and testing piece |
Takao Fukuoka |
2006-08-29 |
| 7075139 |
Method of manufacturing semiconductor device |
Takashi Kobayashi |
2006-07-11 |
| 6777243 |
Method for measuring substance and testing piece |
Takao Fukuoka |
2004-08-17 |
| 6764902 |
Method of manufacturing semiconductor device |
Takashi Kobayashi |
2004-07-20 |
| 6596585 |
Method of manufacturing semiconductor device |
Takashi Kobayashi |
2003-07-22 |
| 6540962 |
Testing instrument for analyzing liquid sample |
Akio Okubo, Yoshiyuki Tanaka, Yoshihiko Higuchi, Masufumi Koike |
2003-04-01 |
| 6489649 |
Semiconductor device having nonvolatile memory and method of manufacturing thereof |
Takashi Kobayashi |
2002-12-03 |