Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7393502 | Test device for analysis of a liquid sample | Akio Okubo, Yoshiyuki Tanaka, Yoshihiko Higuchi, Masufumi Koike | 2008-07-01 |
| 7189576 | Method for measuring substance and testing piece | Takao Fukuoka, Kenji Yamamoto, Satoshi Yonehara | 2007-03-13 |
| 7153696 | Method for measuring substance and testing piece | Takao Fukuoka, Kenji Yamamoto, Satoshi Yonehara | 2006-12-26 |
| 7098038 | Method for measuring substance and testing piece | Takao Fukuoka | 2006-08-29 |
| 7075139 | Method of manufacturing semiconductor device | Takashi Kobayashi | 2006-07-11 |
| 6777243 | Method for measuring substance and testing piece | Takao Fukuoka | 2004-08-17 |
| 6764902 | Method of manufacturing semiconductor device | Takashi Kobayashi | 2004-07-20 |
| 6596585 | Method of manufacturing semiconductor device | Takashi Kobayashi | 2003-07-22 |
| 6540962 | Testing instrument for analyzing liquid sample | Akio Okubo, Yoshiyuki Tanaka, Yoshihiko Higuchi, Masufumi Koike | 2003-04-01 |
| 6489649 | Semiconductor device having nonvolatile memory and method of manufacturing thereof | Takashi Kobayashi | 2002-12-03 |