JP

Joseph Martin Patterson

AC Applied Micro Circuits: 21 patents #6 of 311Top 2%
JC J. T. Baker Chemical: 4 patents #5 of 22Top 25%
SA Sharp Laboratories Of America: 1 patents #288 of 419Top 70%
SI Siliconsystems: 1 patents #36 of 81Top 45%
ST Steelcloud: 1 patents #6 of 8Top 75%
Overall (All Time): #113,950 of 4,157,543Top 3%
32
Patents All Time

Issued Patents All Time

Showing 25 most recent of 32 patents

Patent #TitleCo-InventorsDate
8907691 Integrated circuit thermally induced noise analysis 2014-12-09
8506355 System and method for in-situ inspection during metallurgical cross-sectioning 2013-08-13
8427580 System and method for data synchronization 2013-04-23
8394244 System and method for laser patterning an integrated circuit etching mask 2013-03-12
8377749 Integrated circuit transmission line 2013-02-19
8268669 Laser optical path detection 2012-09-18
8188760 Curve tracer signal conversion for integrated circuit testing 2012-05-29
8106671 Socketless integrated circuit contact connector 2012-01-31
8106653 Optical-magnetic Kerr effect waveform testing 2012-01-31
8106665 3-D mapping focused beam failure analysis 2012-01-31
7977967 Method for solid state thermal electric logic 2011-07-12
7931849 Non-destructive laser optical integrated circuit package marking 2011-04-26
7932119 Laser optical path detection in integrated circuit packaging 2011-04-26
7916397 Micro array lens using optical fiber 2011-03-29
7772873 Solid state thermal electric logic 2010-08-10
7768338 Thermaltronic analog device 2010-08-03
7768283 Universal socketless test fixture 2010-08-03
7768706 Optical fiber micro array lens 2010-08-03
7659750 Thermal electric NOR gate 2010-02-09
7602218 Thermal electric NAND gate 2009-10-13
7564267 Thermal electric logic circuit 2009-07-21
7402469 System and method for selectivity etching an integrated circuit 2008-07-22
7020476 Wireless network security Christopher Day 2006-03-28
5770946 Photon assisted sub-tunneling electrical probe, probe tip, and probing method 1998-06-23
5508627 Photon assisted sub-tunneling electrical probe, probe tip, and probing method 1996-04-16