Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11276545 | Compensating for an electromagnetic interference induced deviation of an electron beam | Yosef Basson, Yuri Belenky, Lior Klein, Asaf Grosz | 2022-03-15 |
| 9583307 | System and method for controlling specimen outgassing | Emil Weisz | 2017-02-28 |