Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11636587 | Inspection of a semiconductor specimen | Liat Shalom Mermelstein | 2023-04-25 |
| 9711327 | Method and system for optimizing configurable parameters of inspection tools | Amir Wilde | 2017-07-18 |