Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11646173 | Scanning electron microscope and a method for overlay monitoring | Itay Asulin, Emil Weisz, Eitam Yitzchak Vinegrad, Menachem Lapid | 2023-05-09 |
BR
Boris Rozensvaig
Overall (All Time): #2,582,548 of 4,157,543Top 65%
1
Patents All Time