Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7401066 | Correlation of end-of-line data mining with process tool data mining | Israel Beinglass, Amir Feili | 2008-07-15 |
| 6885977 | System to identify a wafer manufacturing problem and method therefor | Yifah Gavra | 2005-04-26 |
| 6744266 | Defect knowledge library | Maya M. Radzinski | 2004-06-01 |
| 6714884 | Method and apparatus for providing communication between a defect source identifier and a tool data collection and control system | Maya M. Radzinski | 2004-03-30 |
| 6701259 | Defect source identifier | Maya M. Radzinski | 2004-03-02 |