| 10936456 |
Handling malfunction in a memory system comprising a nonvolatile memory by monitoring bad-block patterns |
Assaf Shappir, Stas Mouler, Yoav Kasorla |
2021-03-02 |
| 10332608 |
Memory block usage based on block location relative to array edge |
Assaf Shappir, Barak Baum, Roman Guy, Michael Tsohar |
2019-06-25 |
| 10008278 |
Memory block usage based on block location relative to array edge |
Assaf Shappir, Barak Baum, Roman Guy, Michael Tsohar |
2018-06-26 |
| 9672925 |
Storage in charge-trap memory structures using additional electrically-charged regions |
Arik Rizel, Avraham Meir, Eyal Gurgi, Barak Baum |
2017-06-06 |
| 9594615 |
Estimating flash quality using selective error emphasis |
Eyal Gurgi, Moshe Neerman, Naftali Sommer |
2017-03-14 |
| 9455040 |
Mitigating reliability degradation of analog memory cells during long static and erased state retention |
Yoav Kasorla, Moshe Neerman, Naftali Sommer, Avraham Meir, Etai Zaltsman +2 more |
2016-09-27 |
| 9390809 |
Data storage in a memory block following WL-WL short |
Avraham Meir, Barak Baum, Eyal Gurgi |
2016-07-12 |
| 9330783 |
Identifying word-line-to-substrate and word-line-to-word-line short-circuit events in a memory block |
Barak Rotbard, Avraham Meir, Eyal Gurgi, Barak Baum |
2016-05-03 |
| 9312017 |
Storage in charge-trap memory structures using additional electrically-charged regions |
Arik Rizel, Avraham Meir, Eyal Gurgi, Barak Baum |
2016-04-12 |
| 9236132 |
Mitigating reliability degradation of analog memory cells during long static and erased state retention |
Yoav Kasorla, Moshe Neerman, Naftali Sommer, Avraham Meir, Etai Zaltsman +2 more |
2016-01-12 |
| 9230680 |
Applications for inter-word-line programming |
Yoav Kasorla, Eyal Gurgi |
2016-01-05 |
| 9105311 |
Inter-word-line programming in arrays of analog memory cells |
Yoav Kasorla, Eyal Gurgi |
2015-08-11 |
| 8837214 |
Applications for inter-word-line programming |
Yoav Kasorla, Eyal Gurgi |
2014-09-16 |
| 8824214 |
Inter-word-line programming in arrays of analog memory cells |
Yoav Kasorla, Eyal Gurgi |
2014-09-02 |
| 8787057 |
Fast analog memory cell readout using modified bit-line charging configurations |
Eyal Gurgi, Yoav Kasorla |
2014-07-22 |
| 8773905 |
Identifying and mitigating restricted sampling voltage ranges in analog memory cells |
Alex Radinski, Barak Baum, Eyal Gurgi, Micha Anholt, Ronen Dar +1 more |
2014-07-08 |
| 8717826 |
Estimation of memory cell wear level based on saturation current |
Eyal Gurgi, Naftali Sommer |
2014-05-06 |
