Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332765 | Systems and methods for variant testing at scale | Jae-Hyeon Bae, Kurt M. Fredericks, Nicholas Kistner, Andrew Maher, Mahesh Molakalapalli +2 more | 2025-06-17 |
NH
Nihar Ranjan Hati — 1 Patent
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Patents All Time