Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10684307 | Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view | Daniel Koller, Alberto Gomez-Casado | 2020-06-16 |
| 10488434 | Characterizing a height profile of a sample by side view imaging | Martin Godec-Schönbacher, Alberto Gomez-Casado, Daniel Koller | 2019-11-26 |
| 8368393 | Measurement method, sensor arrangement and measurement system | Hubert Zangl, Thomas Bretterklieber, Gerald Steiner | 2013-02-05 |