Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8442662 | Measurement parameter input control device and measurement parameter input control method | Yohei Niki, Eiji Takeda, Keita Masuhara, Takashi Murakami | 2013-05-14 |
| 8391346 | Data signal quality evaluation apparatus | Keita Masuhara | 2013-03-05 |
| 8143959 | Jitter generation apparatus, device test system using the same, and jitter generation method | Katsuyuki Yaginuma | 2012-03-27 |
| 7574311 | Time interval measuring apparatus and jitter measuring apparatus using the same | Ken Mochizuki, Osamu Sugiyama | 2009-08-11 |
| 7010444 | Measuring apparatus and measuring method for pattern dependent jitter | Kazuhiko Ishibe | 2006-03-07 |