Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10317503 | Testing device comprising circuitry to calculate a correction value for calibrating channel loss | Koji Yamashita, Hirofumi Kanno, Toru Otani | 2019-06-11 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10317503 | Testing device comprising circuitry to calculate a correction value for calibrating channel loss | Koji Yamashita, Hirofumi Kanno, Toru Otani | 2019-06-11 |