Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11255719 | Material property inspection apparatus | Ken Shioiri, Takao Tanimoto, Hideyuki Sakamoto | 2022-02-22 |
| 10735113 | Near-field measurement system and near-field measurement method | Hanako Noda | 2020-08-04 |
| 10651954 | Calibration systems and calibration method | Takashi Kawamura | 2020-05-12 |
| 9389255 | Millimeter-wave band spectrum analysis device and analysis method | Akihito Otani, Hitoshi Sekiya | 2016-07-12 |
| 8300734 | Frequency converting system | Hitoshi Sekiya | 2012-10-30 |
| 7394415 | Time-interleaved analog-to-digital converter and high speed signal processing system using the same | Hitoshi Sekiya | 2008-07-01 |