Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5043570 | High resolution microscoping system using convolution integration process | — | 1991-08-27 |
| 4660980 | Apparatus for measuring thickness of object transparent to light utilizing interferometric method | Takahiro Nakamura | 1987-04-28 |