Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5712571 | Apparatus and method for detecting defects arising as a result of integrated circuit processing | — | 1998-01-27 |
| 5670883 | Integrated circuit interlevel conductor defect characterization test structure and system | Scott C. Munroe | 1997-09-23 |